Installation for Thermoreflectometry of Semiconductor Materials in a Strong Magnetic Field at Low Temperatures

A. N. Kotov; Котов А. Н.; A. A. Starostin; Старостин А. А.; V. V. Shangin; Шангин В. В.; S. B. Bobin; Бобин С. Б.; A. T. Lonchakov; Лончаков А. Т.

doi:10.31857/S0032816223030230

Installation for Thermoreflectometry of Semiconductor Materials in a Strong Magnetic Field at Low Temperatures

Autores: Kotov A.N.¹, Starostin A.A.¹, Shangin V.V.¹, Bobin S.B.², Lonchakov A.T.²
Afiliações:
1. Institute of Thermal Physics of the Ural Branch of the Russian Academy of Sciences
2. Mikheev Institute of Metal Physics of the Ural Branch of the Russian Academy of Sciences
Edição: Nº 4 (2023)
Páginas: 89-91
Seção: ОБЩАЯ ЭКСПЕРИМЕНТАЛЬНАЯ ТЕХНИКА
URL: https://vietnamjournal.ru/0032-8162/article/view/670479
DOI: https://doi.org/10.31857/S0032816223030230
EDN: https://elibrary.ru/CWJFVM
ID: 670479

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Resumo
Sobre autores
Bibliografia
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Estatísticas

Resumo

An experimental cell design and an optoelectronic unit have been developed for studying relaxation processes in the near-surface region of semiconductors under pulsed laser irradiation in a temperature range from 3 to 300 K and a magnetic field up to 12 T.

Sobre autores

A. Kotov

Institute of Thermal Physics of the Ural Branch of the Russian Academy of Sciences

Email: artem625@mail.ru
Russia, 620016, Yekaterinburg

A. Starostin

Institute of Thermal Physics of the Ural Branch of the Russian Academy of Sciences

Email: artem625@mail.ru
Russia, 620016, Yekaterinburg

V. Shangin

Institute of Thermal Physics of the Ural Branch of the Russian Academy of Sciences

Email: artem625@mail.ru
Russia, 620016, Yekaterinburg

S. Bobin

Mikheev Institute of Metal Physics of the Ural Branch of the Russian Academy of Sciences

Email: artem625@mail.ru
Russia, 620108, Yekaterinburg

A. Lonchakov

Mikheev Institute of Metal Physics of the Ural Branch of the Russian Academy of Sciences

Autor responsável pela correspondência
Email: artem625@mail.ru
Russia, 620108, Yekaterinburg

Bibliografia

Starostin A.A., Shangin V.V., Lonchakov A.T., Kotov A.N., Bobin S.B. // Annalen der Physik 2020. V. 532. Iss. 8. P. 1900586. https://doi.org/10.1002/andp.201900586
Wang T., Zheng S., Yang Z. // Sensors and Actuators A. 1998. V. 69. P. 134.
Новицкий Л.А., Кожевников И.Г. Теплофизические свойства материалов при низких температурах. Справочник. М.: Машиностроение, 1975.