Interference Transport in a Two-Dimensional Topological Insulator in a CdHgTe Quantum Well
- Authors: Ryzhkov M.S1,2, Kozlov D.A1,3, Khudayberdiev D.A1, Kvon Z.D1,2, Mikhaylov N.N1
 - 
							Affiliations: 
							
- Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences
 - Novosibirsk State University
 - Experimental and Applied Physics, University of Regensburg
 
 - Issue: Vol 117, No 1-2 (1) (2023)
 - Pages: 50-54
 - Section: Articles
 - URL: https://vietnamjournal.ru/0370-274X/article/view/663576
 - DOI: https://doi.org/10.31857/S1234567823010068
 - EDN: https://elibrary.ru/NVHYAF
 - ID: 663576
 
Cite item
Abstract
Interference transport in mesoscopic samples of a two-dimensional topological insulator in CdHgTe quantum wells is studied for the first time. It is established that quasi-ballistic edge transport in such an insulator exists at lengths up to 10 µm. In this transport regime, almost periodic Aharonov–Bohm oscillations caused by the formation of closed loops with a characteristic size of about 200 nm by edge states are found. The phase coherence length in the two-dimensional topological insulator is determined for the first time from the measured temperature dependence of their amplitude.
About the authors
M. S Ryzhkov
Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences; Novosibirsk State University
														Email: dimko@isp.nsc.ru
				                					                																			                												                								630090, Novosibirsk, Russia; 630090, Novosibirsk, Russia						
D. A Kozlov
Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences; Experimental and Applied Physics, University of Regensburg
														Email: dimko@isp.nsc.ru
				                					                																			                												                								630090, Novosibirsk, Russia; D-93040, Regensburg, Germany						
D. A Khudayberdiev
Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences
														Email: dimko@isp.nsc.ru
				                					                																			                												                								630090, Novosibirsk, Russia						
Z. D Kvon
Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences; Novosibirsk State University
														Email: dimko@isp.nsc.ru
				                					                																			                												                								630090, Novosibirsk, Russia; 630090, Novosibirsk, Russia						
N. N Mikhaylov
Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences
							Author for correspondence.
							Email: dimko@isp.nsc.ru
				                					                																			                												                								630090, Novosibirsk, Russia						
References
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